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Join us at the WCNDT! We're thrilled to exhibit at this global event, where we look forward to an interchange of ideas with colleagues from all around the world working in industrial CT.
Be sure to catch our presentation "A Reference-free Approach for Pore Detection in CT-Scans of Varying Image Quality Using Deep Learning" by Christy Joseph and visit us at booth B22.
We are part of the Hexagon Group. You can view the upcoming Hexagon events here:
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